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Modeling the temperature induced degradation kinetics of the short circuit current in organic bulk heterojunction solar cells

dc.contributor.authorConings, B.
dc.contributor.authorBertho, S.
dc.contributor.authorVandewal, Koen
dc.contributor.authorSenes, A.
dc.contributor.authorD'Haen, Jan
dc.contributor.authorManca, Jean
dc.contributor.authorJanssen, R.A.J.
dc.date.accessioned2021-10-18T15:41:07Z
dc.date.available2021-10-18T15:41:07Z
dc.date.issued2010
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16903
dc.sourceIIOimport
dc.titleModeling the temperature induced degradation kinetics of the short circuit current in organic bulk heterojunction solar cells
dc.typeJournal article
dc.contributor.imecauthorVandewal, Koen
dc.contributor.imecauthorD'Haen, Jan
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage163301
dc.source.journalApplied Physics Letters
dc.source.issue16
dc.source.volume96
imec.availabilityPublished - open access


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