dc.contributor.author | Cornagliotti, Emanuele | |
dc.contributor.author | Dekkers, Harold | |
dc.contributor.author | Prastani, Caterina | |
dc.contributor.author | John, Joachim | |
dc.contributor.author | Van Kerschaver, Emmanuel | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Mertens, Robert | |
dc.date.accessioned | 2021-10-18T15:41:27Z | |
dc.date.available | 2021-10-18T15:41:27Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 1662-9779 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16905 | |
dc.source | IIOimport | |
dc.title | Bulk passivation of defects in multi-crystalline silicon solar cells by a-SiNx:H layers | |
dc.type | Journal article | |
dc.contributor.imecauthor | Cornagliotti, Emanuele | |
dc.contributor.imecauthor | Dekkers, Harold | |
dc.contributor.imecauthor | John, Joachim | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Mertens, Robert | |
dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 357 | |
dc.source.endpage | 362 | |
dc.source.journal | Solid State Phenomena | |
dc.source.volume | 156-158 | |
dc.identifier.url | www.scientific.net | |
imec.availability | Published - imec | |
imec.internalnotes | Gettering and Defect Engineering in Semiconductor Technology XIII | |