Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories
dc.contributor.author | Deleruyelle, Damien | |
dc.contributor.author | Muller, Christophe | |
dc.contributor.author | Amouroux, Julien | |
dc.contributor.author | Muller, Robert | |
dc.date.accessioned | 2021-10-18T15:59:23Z | |
dc.date.available | 2021-10-18T15:59:23Z | |
dc.date.issued | 2010-06 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17006 | |
dc.source | IIOimport | |
dc.title | Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories | |
dc.type | Journal article | |
dc.source.peerreview | yes | |
dc.source.beginpage | 263504-1 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 26 | |
dc.source.volume | 96 | |
dc.identifier.url | http://dx.doi.org/10.1063/1.3458596 | |
imec.availability | Published - imec |
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