Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple FinFETs
dc.contributor.author | dos Santos, S.D. | |
dc.contributor.author | Martino, J.A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-18T16:06:02Z | |
dc.date.available | 2021-10-18T16:06:02Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 1807-1953 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17037 | |
dc.source | IIOimport | |
dc.title | Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple FinFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 154 | |
dc.source.endpage | 159 | |
dc.source.journal | Journal of Integrated Circuits and Systems | |
dc.source.issue | 2 | |
dc.source.volume | 5 | |
imec.availability | Published - open access |