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dc.contributor.authorGoux, Ludovic
dc.contributor.authorCzarnecki, Piotr
dc.contributor.authorChen, Yangyin
dc.contributor.authorPantisano, Luigi
dc.contributor.authorWang, XinPeng
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorJurczak, Gosia
dc.contributor.authorWouters, Dirk
dc.contributor.authorAltimime, Laith
dc.date.accessioned2021-10-18T16:39:50Z
dc.date.available2021-10-18T16:39:50Z
dc.date.issued2010
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17174
dc.sourceIIOimport
dc.titleEvidences of oxygen-mediated resistive-switching mechanism in TiN\HfO2\Pt cells
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorCzarnecki, Piotr
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage243509
dc.source.journalApplied Physics Letters
dc.source.issue24
dc.source.volume97
dc.identifier.urlURL: http://link.aip.org/link/?APL/97/243509
imec.availabilityPublished - imec


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