dc.contributor.author | Griffoni, Alessio | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Russ, Christian | |
dc.contributor.author | Tremouilles, David | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Meneghesso, Gaudenzio | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-18T16:44:40Z | |
dc.date.available | 2021-10-18T16:44:40Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 1530-4388 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17191 | |
dc.source | IIOimport | |
dc.title | Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 130 | |
dc.source.endpage | 141 | |
dc.source.journal | IEEE Transactions on Device and Materials Reliability | |
dc.source.issue | 1 | |
dc.source.volume | 10 | |
dc.identifier.url | http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5339158&queryText%3Dgriffoni%26openedRefinements%3D*%26searchFie | |
imec.availability | Published - open access | |