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High resolution structure imaging of octohedral void defects

dc.contributor.authorBender, Hugo
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSchmolke, R.
dc.date.accessioned2021-09-30T07:56:22Z
dc.date.available2021-09-30T07:56:22Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1729
dc.sourceIIOimport
dc.titleHigh resolution structure imaging of octohedral void defects
dc.typeJournal article
dc.contributor.imecauthorBender, Hugo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageL1217
dc.source.endpageL1220
dc.source.journalJapanese Journal of Applied Physics. Part 2: Letters
dc.source.issue9A_B
dc.source.volume36
imec.availabilityPublished - open access


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