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Effects of electron irradiation on SiGe devices

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorNagano, T.
dc.contributor.authorTakakura, K.
dc.contributor.authorMotoki, M.
dc.contributor.authorMatsuo, K.
dc.contributor.authorNakamura, H.
dc.contributor.authorSawada, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-18T19:46:30Z
dc.date.available2021-10-18T19:46:30Z
dc.date.issued2010
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17724
dc.sourceIIOimport
dc.titleEffects of electron irradiation on SiGe devices
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.source.peerreviewyes
dc.source.beginpage2517
dc.source.endpage2520
dc.source.journalThin Solid Films
dc.source.issue9
dc.source.volume518
imec.availabilityPublished - imec


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