Influence of fin width on the total dose behavior of p-channe bulk MuGFETs
dc.contributor.author | Put, Sofie | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Van Uffelen, Marco | |
dc.contributor.author | Leroux, Paul | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-18T20:40:17Z | |
dc.date.available | 2021-10-18T20:40:17Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17860 | |
dc.source | IIOimport | |
dc.title | Influence of fin width on the total dose behavior of p-channe bulk MuGFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 243 | |
dc.source.endpage | 245 | |
dc.source.journal | IEEE Electron Device Letters | |
dc.source.issue | 3 | |
dc.source.volume | 31 | |
imec.availability | Published - open access |