Electrical defects in high-k / metal gate MOS transistors
| dc.contributor.author | Sahhaf, Sahar | |
| dc.date.accessioned | 2021-10-18T21:08:11Z | |
| dc.date.available | 2021-10-18T21:08:11Z | |
| dc.date.issued | 2010-10 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17926 | |
| dc.source | IIOimport | |
| dc.title | Electrical defects in high-k / metal gate MOS transistors | |
| dc.type | PHD thesis | |
| dc.contributor.imecauthor | Sahhaf, Sahar | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | no | |
| dc.contributor.thesisadvisor | Groeseneken, Guido | |
| imec.availability | Published - open access |