dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Firrincieli, Andrea | |
dc.contributor.author | Leys, Frederik | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-18T21:35:43Z | |
dc.date.available | 2021-10-18T21:35:43Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0040-6090 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/17988 | |
dc.source | IIOimport | |
dc.title | Low-frequency noise asesssment of the silicon passivation of Ge pMOSFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Firrincieli, Andrea | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2493 | |
dc.source.endpage | 2496 | |
dc.source.journal | Thin Solid Films | |
dc.source.issue | 9 | |
dc.source.volume | 518 | |
imec.availability | Published - open access | |