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Thermionic emission as a tool to study transport in undoped nFinFETs

dc.contributor.authorTettamanzi, Giuseppe C.
dc.contributor.authorPaul, Abhijeet
dc.contributor.authorLansbergen, Gabriel P.
dc.contributor.authorVerduijn, Jan
dc.contributor.authorLee, Sunhee
dc.contributor.authorCollaert, Nadine
dc.contributor.authorBiesemans, Serge
dc.contributor.authorKlimeck, Gerhard
dc.contributor.authorRogge, Sven
dc.date.accessioned2021-10-18T22:16:52Z
dc.date.available2021-10-18T22:16:52Z
dc.date.issued2010
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18078
dc.sourceIIOimport
dc.titleThermionic emission as a tool to study transport in undoped nFinFETs
dc.typeJournal article
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage150
dc.source.endpage152
dc.source.journalIEEE Electron Device Letters
dc.source.issue2
dc.source.volume31
imec.availabilityPublished - open access


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