Show simple item record

Transmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics

dc.contributor.authorTorres-Torres, Reydezel
dc.contributor.authorVenegas, Rafael
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-18T22:28:05Z
dc.date.available2021-10-18T22:28:05Z
dc.date.issued2010
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18102
dc.sourceIIOimport
dc.titleTransmission line characterization on silicon considering arbitrary distribution of the series and shunt pad parasitics
dc.typeJournal article
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage235
dc.source.endpage242
dc.source.journalSolid-State Electronics
dc.source.issue3
dc.source.volume54
dc.identifier.urlwww.elsevier.com/locate/sse
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record