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Injection and trapping of electrons in Y2O3 layers on Si

dc.contributor.authorWang, Mugwort
dc.contributor.authorBadylevich, M.
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorStesmans, Andre
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorKittl, Jorge
dc.contributor.authorLukosius, M.
dc.contributor.authorWalczyk, C.
dc.contributor.authorWenger, C.
dc.date.accessioned2021-10-19T00:19:38Z
dc.date.available2021-10-19T00:19:38Z
dc.date.issued2010
dc.identifier.issn1757-8981
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18337
dc.sourceIIOimport
dc.titleInjection and trapping of electrons in Y2O3 layers on Si
dc.typeJournal article
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.source.peerreviewyes
dc.source.beginpage12028
dc.source.journalIOP Conference Series: Materials Science and Engineering
dc.source.issue1
dc.source.volume8
imec.availabilityPublished - imec
imec.internalnotesPaper from E-MRS Spring Meeting 2009


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