Show simple item record

Defect assessment control and engineering in advanced homo- and hetero-epitaxial device structures

dc.contributor.authorBargallo Gonzalez, Mireia
dc.date.accessioned2021-10-19T12:31:38Z
dc.date.available2021-10-19T12:31:38Z
dc.date.issued2011-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18527
dc.sourceIIOimport
dc.titleDefect assessment control and engineering in advanced homo- and hetero-epitaxial device structures
dc.typePHD thesis
dc.source.peerreviewno
dc.contributor.thesisadvisorClaeys, Cor
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record