Through-silicon via technology for 3D IC
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-19T12:35:21Z | |
dc.date.available | 2021-10-19T12:35:21Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18576 | |
dc.source | IIOimport | |
dc.title | Through-silicon via technology for 3D IC | |
dc.type | Book chapter | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 93 | |
dc.source.book | Ultra-Thin Chip Technology and Applications | |
dc.source.endpage | 108 | |
imec.availability | Published - open access |