Effects of hole and electron trapping on organic field-effect transistor transfer characteristic

dc.contributor.author	Bolsée, J.C.
dc.contributor.author	Manca, Jean
dc.date.accessioned	2021-10-19T12:37:38Z
dc.date.available	2021-10-19T12:37:38Z
dc.date.issued	2011
dc.identifier.issn	0379-6779
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/18600
dc.source	IIOimport
dc.title	Effects of hole and electron trapping on organic field-effect transistor transfer characteristic
dc.type	Journal article
dc.date.embargo	9999-12-31
dc.source.peerreview	yes
dc.source.beginpage	789
dc.source.endpage	793
dc.source.journal	Synthetic Metals
dc.source.issue	9_10
dc.source.volume	161
imec.availability	Published - open access