dc.contributor.author | Bossuyt, Frederick | |
dc.contributor.author | Guenther, J. | |
dc.contributor.author | Löher, T. | |
dc.contributor.author | Seckel, M. | |
dc.contributor.author | Sterken, Tom | |
dc.contributor.author | De Vries, J. | |
dc.date.accessioned | 2021-10-19T12:38:46Z | |
dc.date.available | 2021-10-19T12:38:46Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18611 | |
dc.source | IIOimport | |
dc.title | Cyclic endurance reliability of stretchable electronic substrates | |
dc.type | Journal article | |
dc.contributor.imecauthor | Bossuyt, Frederick | |
dc.contributor.imecauthor | Sterken, Tom | |
dc.contributor.orcidimec | Bossuyt, Frederick::0000-0003-3350-9295 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 628 | |
dc.source.endpage | 635 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 3 | |
dc.source.volume | 51 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0026271410005226 | |
imec.availability | Published - imec | |