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dc.contributor.authorBrusamarello, Lucas
dc.contributor.authorWirth, Gilson
dc.contributor.authorRoussel, Philippe
dc.contributor.authorMiranda Corbalan, Miguel
dc.date.accessioned2021-10-19T12:40:36Z
dc.date.available2021-10-19T12:40:36Z
dc.date.issued2011
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18627
dc.sourceIIOimport
dc.titleFast and accurate statistical characterization of standard cell libraries
dc.typeJournal article
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2341
dc.source.endpage2350
dc.source.journalMicroelectronics Reliability
dc.source.issue12
dc.source.volume51
dc.identifier.urlhttp://authors.elsevier.com/TrackPaper.html?trk_article=MR10025&trk_surname=Brusamarello
imec.availabilityPublished - open access


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