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Comparison of the low-frequency noise of bulk triple-gate FinFETs with and without dynamic threshold operation

dc.contributor.authorCano de Andrade, Gloria
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-19T12:42:10Z
dc.date.available2021-10-19T12:42:10Z
dc.date.issued2011
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18640
dc.sourceIIOimport
dc.titleComparison of the low-frequency noise of bulk triple-gate FinFETs with and without dynamic threshold operation
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1597
dc.source.endpage1599
dc.source.journalIEEE Electron Device Letters
dc.source.issue11
dc.source.volume32
imec.availabilityPublished - open access


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