Show simple item record

Measuring the electrical resistivity and contact resistance of vertical carbon nanotube bundles for application as interconnects

dc.contributor.authorChiodarelli, Nicolo
dc.contributor.authorMasahito, Sugiura
dc.contributor.authorKashiwagi, Yusaku
dc.contributor.authorLi, Yunlong
dc.contributor.authorArstila, Kai
dc.contributor.authorRichard, Olivier
dc.contributor.authorCott, Daire
dc.contributor.authorHeyns, Marc
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVereecken, Philippe
dc.date.accessioned2021-10-19T12:48:34Z
dc.date.available2021-10-19T12:48:34Z
dc.date.issued2011
dc.identifier.issn0957-4484
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18686
dc.sourceIIOimport
dc.titleMeasuring the electrical resistivity and contact resistance of vertical carbon nanotube bundles for application as interconnects
dc.typeJournal article
dc.contributor.imecauthorLi, Yunlong
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVereecken, Philippe
dc.contributor.orcidimecLi, Yunlong::0000-0003-4791-4013
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.contributor.orcidimecVereecken, Philippe::0000-0003-4115-0075
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage85302
dc.source.journalNanotechnology
dc.source.issue8
dc.source.volume22
dc.identifier.urlhttp://iopscience.iop.org/0957-4484/22/8/085302/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
21739.pdf
Size:
335.0Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record