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Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures

dc.contributor.authorEyben, Pierre
dc.contributor.authorSeidel, Felix
dc.contributor.authorHantschel, Thomas
dc.contributor.authorSchulze, Andreas
dc.contributor.authorLorenz, Anne
dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorVan Gestel, Dries
dc.contributor.authorJohn, Joachim
dc.contributor.authorHorzel, Jörg
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-19T13:27:55Z
dc.date.available2021-10-19T13:27:55Z
dc.date.issued2011
dc.identifier.issn0031-8965
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18892
dc.sourceIIOimport
dc.titleDevelopment and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
dc.typeJournal article
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorSeidel, Felix
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorJohn, Joachim
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage596
dc.source.endpage599
dc.source.journalPhysica Status Solidi A
dc.source.issue3
dc.source.volume208
imec.availabilityPublished - open access


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