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Positive bias temperature instabilities on sub-nanometer EOT FinFETs

dc.contributor.authorFeijoo, Pedro C.
dc.contributor.authorCho, Moon Ju
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorSan Andrés, Enrique
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T13:30:34Z
dc.date.available2021-10-19T13:30:34Z
dc.date.issued2011
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18903
dc.sourceIIOimport
dc.titlePositive bias temperature instabilities on sub-nanometer EOT FinFETs
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewyes
dc.source.beginpage1521
dc.source.endpage1524
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume51
imec.availabilityPublished - imec
imec.internalnotesESREF (Bordeaux, 2011) paper


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