dc.contributor.author | Fleischmann, Claudia | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Beckhoff, Burkhard | |
dc.contributor.author | Muller, Matthias | |
dc.contributor.author | Honicke, Phillip | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Temst, Kristiaan | |
dc.contributor.author | Vantomme, Andre | |
dc.date.accessioned | 2021-10-19T13:33:27Z | |
dc.date.available | 2021-10-19T13:33:27Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0013-4651 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18915 | |
dc.source | IIOimport | |
dc.title | Self-affine surface roughness of chemically and thermally cleaned Ge surfaces | |
dc.type | Journal article | |
dc.contributor.imecauthor | Fleischmann, Claudia | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Temst, Kristiaan | |
dc.contributor.imecauthor | Vantomme, Andre | |
dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | H1090 | |
dc.source.endpage | H1096 | |
dc.source.journal | Journal of the Electrochemical Society | |
dc.source.issue | 10 | |
dc.source.volume | 158 | |
imec.availability | Published - open access | |