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dc.contributor.authorFleischmann, Claudia
dc.contributor.authorSeidel, F.
dc.contributor.authorMerckling, Clement
dc.contributor.authorVincent, Benjamin
dc.contributor.authorGencarelli, Federica
dc.contributor.authorLoo, Roger
dc.contributor.authorShimura, Y.
dc.contributor.authorNakatsuka, O.
dc.contributor.authorZaima, S.
dc.contributor.authorCaymax, Matty
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorTemst, Kristiaan
dc.contributor.authorVantomme, Andre
dc.date.accessioned2021-10-19T13:33:44Z
dc.date.available2021-10-19T13:33:44Z
dc.date.issued2011-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18916
dc.sourceIIOimport
dc.titleTowards an understanding of the atomic-scale surface properties of Ge1-xSnx films
dc.typeMeeting abstract
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.imecauthorVantomme, Andre
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceThe 2nd GeSn workshop: GeSn Developments and Future Applications
dc.source.conferencedate2/09/2011
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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