dc.contributor.author | Fleischmann, Claudia | |
dc.contributor.author | Seidel, F. | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Gencarelli, Federica | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Shimura, Y. | |
dc.contributor.author | Nakatsuka, O. | |
dc.contributor.author | Zaima, S. | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Temst, Kristiaan | |
dc.contributor.author | Vantomme, Andre | |
dc.date.accessioned | 2021-10-19T13:33:44Z | |
dc.date.available | 2021-10-19T13:33:44Z | |
dc.date.issued | 2011-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18916 | |
dc.source | IIOimport | |
dc.title | Towards an understanding of the atomic-scale surface properties of Ge1-xSnx films | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Fleischmann, Claudia | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Temst, Kristiaan | |
dc.contributor.imecauthor | Vantomme, Andre | |
dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.source.peerreview | no | |
dc.source.conference | The 2nd GeSn workshop: GeSn Developments and Future Applications | |
dc.source.conferencedate | 2/09/2011 | |
dc.source.conferencelocation | Leuven Belgium | |
imec.availability | Published - imec | |