Show simple item record

Analog performance of SOI MOSFETs with different TiN gate electrode thickness and hHigh-k dielectrics

dc.contributor.authorGaleti, M.
dc.contributor.authorRodrigues, M.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, J.A.
dc.date.accessioned2021-10-19T13:39:44Z
dc.date.available2021-10-19T13:39:44Z
dc.date.issued2011
dc.identifier.issn1807-1953
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18939
dc.sourceIIOimport
dc.titleAnalog performance of SOI MOSFETs with different TiN gate electrode thickness and hHigh-k dielectrics
dc.typeJournal article
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage102
dc.source.endpage106
dc.source.journalJournal of Integrated Circuits and Systems
dc.source.issue2
dc.source.volume6
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
23297.pdf
Size:
986.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record