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Bistable defects as the cause for NBTI and RTN

dc.contributor.authorGoes, Wolfgang
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorReisinger, Hans
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-19T13:47:15Z
dc.date.available2021-10-19T13:47:15Z
dc.date.issued2011-08
dc.identifier.issn1662-9779
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18967
dc.sourceIIOimport
dc.titleBistable defects as the cause for NBTI and RTN
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.identifier.doi10.4028/www.scientific.net/SSP.178-179.473
dc.source.peerreviewyes
dc.source.beginpage473
dc.source.endpage482
dc.source.journalSolid State Phenomena
dc.source.volume178-179
imec.availabilityPublished - imec
imec.internalnotesGettering and Defect Engineering in Semiconductor Technology XIV


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