dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Chou, H.-Y. | |
dc.contributor.author | Afanasiev, Valeri | |
dc.contributor.author | Meersschaut, Johan | |
dc.contributor.author | Toeller, Michael | |
dc.contributor.author | Wang, X.P. | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | Richard, Olivier | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Altimime, Laith | |
dc.date.accessioned | 2021-10-19T13:53:08Z | |
dc.date.available | 2021-10-19T13:53:08Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18989 | |
dc.source | IIOimport | |
dc.title | Evidences of anodic-oxidation reset mechanism in TiN\NiO\Ni RRAM cells | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Afanasiev, Valeri | |
dc.contributor.imecauthor | Meersschaut, Johan | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.contributor.orcidimec | Meersschaut, Johan::0000-0003-2467-1784 | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 24 | |
dc.source.endpage | 25 | |
dc.source.conference | Symposium on VLSI Technology | |
dc.source.conferencedate | 13/06/2011 | |
dc.source.conferencelocation | Japan Kyoto | |
imec.availability | Published - open access | |