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Analysis of charge pumping characteristics of single interface traps

dc.contributor.authorHabas, Predrag
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorStesmans, Andre
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-30T08:22:50Z
dc.date.available2021-09-30T08:22:50Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1914
dc.sourceIIOimport
dc.titleAnalysis of charge pumping characteristics of single interface traps
dc.typeOral presentation
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorStesmans, Andre
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceSemiconductor Interface Specialists' Conference - SISC
dc.source.conferencedate4/12/1997
dc.source.conferencelocationCharleston, SC USA
imec.availabilityPublished - open access


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