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Enhanced sensitivity of silicon-on-insulator surface plasmon interferometer with additional silicon layer

dc.contributor.authorLe, Khai Q.
dc.contributor.authorBienstman, Peter
dc.date.accessioned2021-10-19T15:17:11Z
dc.date.available2021-10-19T15:17:11Z
dc.date.issued2011-06
dc.identifier.issn1943-0655
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19257
dc.sourceIIOimport
dc.titleEnhanced sensitivity of silicon-on-insulator surface plasmon interferometer with additional silicon layer
dc.typeJournal article
dc.contributor.imecauthorBienstman, Peter
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage538
dc.source.endpage545
dc.source.journalIEEE Photonics Journal
dc.source.issue3
dc.source.volume3
imec.availabilityPublished - open access


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