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A single pulse charge pumping technique for fast measurements of interface states

dc.contributor.authorLin, L.
dc.contributor.authorJi, Zhigang
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-19T15:33:08Z
dc.date.available2021-10-19T15:33:08Z
dc.date.issued2011
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19304
dc.sourceIIOimport
dc.titleA single pulse charge pumping technique for fast measurements of interface states
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1490
dc.source.endpage1498
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue5
dc.source.volume58
imec.availabilityPublished - open access


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