Investigation of tri-gate FinFETs by noise methods
dc.contributor.author | Lukyanchikova, N. | |
dc.contributor.author | Garbar, N. | |
dc.contributor.author | Kudina, V. | |
dc.contributor.author | Smolanka, A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-19T15:48:01Z | |
dc.date.available | 2021-10-19T15:48:01Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19345 | |
dc.source | IIOimport | |
dc.title | Investigation of tri-gate FinFETs by noise methods | |
dc.type | Book chapter | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 287 | |
dc.source.book | Semiconductor-On-Insulator Materials for Nanoelectronics Applications | |
dc.source.endpage | 306 | |
imec.availability | Published - open access | |
imec.internalnotes | Engineering Materials |