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Unravelling the mysteries of HEMT degradation

dc.contributor.authorMarcon, Denis
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-19T16:01:47Z
dc.date.available2021-10-19T16:01:47Z
dc.date.issued2011
dc.identifier.issn1096-598X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19381
dc.sourceIIOimport
dc.titleUnravelling the mysteries of HEMT degradation
dc.typeJournal article
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage14
dc.source.endpage19
dc.source.journalCompound Semiconductor
dc.source.issue4
dc.source.volume17
dc.identifier.urlhttp://content.yudu.com/A1sg95/ComSemiJune2011/resources/14.htm
imec.availabilityPublished - imec


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