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A compact NBTI model for accurate analog integrated circuit reliability simulation

dc.contributor.authorMaricau, Elie
dc.contributor.authorZhang, Leqi
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGielen, Georges
dc.date.accessioned2021-10-19T16:02:56Z
dc.date.available2021-10-19T16:02:56Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19384
dc.sourceIIOimport
dc.titleA compact NBTI model for accurate analog integrated circuit reliability simulation
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.beginpage147
dc.source.endpage150
dc.source.conferenceEuropean Solid State Device Research Conference - ESSDERC
dc.source.conferencedate12/09/2011
dc.source.conferencelocationHelsinki Finland
imec.availabilityPublished - imec


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