dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Dobbie, Andrew | |
dc.contributor.author | Myronov, M. | |
dc.contributor.author | Kobayashi, Masaharu | |
dc.contributor.author | Geypen, Jef | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Krom, Raymond | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Winderickx, Gillis | |
dc.contributor.author | Vrancken, Evi | |
dc.contributor.author | Vanherle, Wendy | |
dc.contributor.author | Wang, Wei-E | |
dc.contributor.author | Tseng, Joshua | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Pantisano, Luigi | |
dc.contributor.author | Leadley, D.R | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Absil, Philippe | |
dc.contributor.author | Biesemans, Serge | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.date.accessioned | 2021-10-19T16:24:26Z | |
dc.date.available | 2021-10-19T16:24:26Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0021-4922 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19438 | |
dc.source | IIOimport | |
dc.title | High hole mobility in 65 nm strained Ge p-channel field effect transistors with HfO2 gate dielectric | |
dc.type | Journal article | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Geypen, Jef | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Winderickx, Gillis | |
dc.contributor.imecauthor | Vrancken, Evi | |
dc.contributor.imecauthor | Vanherle, Wendy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 04DC17 | |
dc.source.journal | Japanese Journal of Applied Physics | |
dc.source.issue | 4 | |
dc.source.volume | 50 | |
imec.availability | Published - open access | |