Control of filament size and reduction of reset current below 10μA in NiO resistance switching memories
dc.contributor.author | Nardi, F. | |
dc.contributor.author | Ielmini, D. | |
dc.contributor.author | Cagli, C. | |
dc.contributor.author | Spiga, S. | |
dc.contributor.author | Fanciulli, M. | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Wouters, Dirk | |
dc.date.accessioned | 2021-10-19T16:38:18Z | |
dc.date.available | 2021-10-19T16:38:18Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19472 | |
dc.source | IIOimport | |
dc.title | Control of filament size and reduction of reset current below 10μA in NiO resistance switching memories | |
dc.type | Journal article | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 42 | |
dc.source.endpage | 47 | |
dc.source.journal | Solid-State Electronics | |
dc.source.issue | 1 | |
dc.source.volume | 58 | |
imec.availability | Published - imec |
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