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Integrated polarization analyzing CMOS image sensor for material classification

dc.contributor.authorSarkar, Mukul
dc.contributor.authorSan Segundo Bello, David
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorTheuwissen, Albert
dc.date.accessioned2021-10-19T18:27:51Z
dc.date.available2021-10-19T18:27:51Z
dc.date.issued2011
dc.identifier.issn1530-437X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19733
dc.sourceIIOimport
dc.titleIntegrated polarization analyzing CMOS image sensor for material classification
dc.typeJournal article
dc.contributor.imecauthorVan Hoof, Chris
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1692
dc.source.endpage1703
dc.source.journalIEEE Sensors Journal
dc.source.issue8
dc.source.volume11
imec.availabilityPublished - open access


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