dc.contributor.author | Shi, Xiaoping | |
dc.contributor.author | Tielens, Hilde | |
dc.contributor.author | Takeoka, Shinji | |
dc.contributor.author | Nakabayashi, Takashi | |
dc.contributor.author | Nyns, Laura | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Delabie, Annelies | |
dc.contributor.author | Schram, Tom | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Schaekers, Marc | |
dc.contributor.author | Date, Lucien | |
dc.contributor.author | Schreutelkamp, Rob | |
dc.contributor.author | Van Elshocht, Sven | |
dc.date.accessioned | 2021-10-19T18:44:21Z | |
dc.date.available | 2021-10-19T18:44:21Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0013-4651 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19770 | |
dc.source | IIOimport | |
dc.title | Development of ALD HfZrOx with TDEAH/TDEAZ and H2O | |
dc.type | Journal article | |
dc.contributor.imecauthor | Tielens, Hilde | |
dc.contributor.imecauthor | Nyns, Laura | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Delabie, Annelies | |
dc.contributor.imecauthor | Schram, Tom | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Schaekers, Marc | |
dc.contributor.imecauthor | Date, Lucien | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.orcidimec | Nyns, Laura::0000-0001-8220-870X | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Schaekers, Marc::0000-0002-1496-7816 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.source.peerreview | yes | |
dc.source.beginpage | H69 | |
dc.source.endpage | H74 | |
dc.source.journal | Journal of the Electrochemical Society | |
dc.source.issue | 1 | |
dc.source.volume | 158 | |
dc.identifier.url | http://link.aip.org/link/?JES/158/H69 | |
imec.availability | Published - imec | |