dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Bargallo Gonzalez, Mireia | |
dc.contributor.author | Kobayashi, Daisuke | |
dc.contributor.author | Luque Rodriguez, Abraham | |
dc.contributor.author | Jimenez Tejada, J.-A. | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-19T18:52:22Z | |
dc.date.available | 2021-10-19T18:52:22Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0013-4651 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19786 | |
dc.source | IIOimport | |
dc.title | High doping density/high electric field, stress and heterojunction effects on the characteristisc of CMOS compatible p-n junctions | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | R27 | |
dc.source.endpage | R36 | |
dc.source.journal | Journal of the Electrochemical Society | |
dc.source.issue | 5 | |
dc.source.volume | 158 | |
imec.availability | Published - open access | |