A deep-level analysis of Ni-Au/AlN(111) p-Si metal-insulator-semiconductor capacitors
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Visalli, Domenica | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Leys, Maarten | |
dc.contributor.author | Borghs, Gustaaf | |
dc.date.accessioned | 2021-10-19T18:57:22Z | |
dc.date.available | 2021-10-19T18:57:22Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0022-3727 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19797 | |
dc.source | IIOimport | |
dc.title | A deep-level analysis of Ni-Au/AlN(111) p-Si metal-insulator-semiconductor capacitors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Borghs, Gustaaf | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 475104 | |
dc.source.journal | Journal of Physics D: Applied Physics | |
dc.source.issue | 47 | |
dc.source.volume | 44 | |
imec.availability | Published - open access |