Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission lines
| dc.contributor.author | Laermans, Eric | |
| dc.contributor.author | Olyslager, Frank | |
| dc.contributor.author | De Zutter, Daniel | |
| dc.date.accessioned | 2021-09-30T08:35:51Z | |
| dc.date.available | 2021-09-30T08:35:51Z | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1979 | |
| dc.source | IIOimport | |
| dc.title | Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission lines | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Laermans, Eric | |
| dc.contributor.imecauthor | De Zutter, Daniel | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 1483 | |
| dc.source.endpage | 1508 | |
| dc.source.journal | Journal of Electromagnetic Waves and Applications | |
| dc.source.volume | 11 | |
| imec.availability | Published - imec |
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