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Effect of source-drain electric field on the Meyer-Neldel energy in organic field effect transistors

dc.contributor.authorUllah, Mujeeb
dc.contributor.authorPivrikas, Almantas
dc.contributor.authorFishchuk, Ivan
dc.contributor.authorKadashchuk, Andriy
dc.contributor.authorStadler, Peter
dc.contributor.authorSimbrunner, Clements
dc.contributor.authorSariciftci, Serdar
dc.contributor.authorSitter, Helmut
dc.date.accessioned2021-10-19T19:59:19Z
dc.date.available2021-10-19T19:59:19Z
dc.date.issued2011
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19927
dc.sourceIIOimport
dc.titleEffect of source-drain electric field on the Meyer-Neldel energy in organic field effect transistors
dc.typeJournal article
dc.contributor.imecauthorKadashchuk, Andriy
dc.contributor.orcidimecKadashchuk, Andriy::0000-0001-8459-7825
dc.source.peerreviewyes
dc.source.beginpage223301
dc.source.journalApplied Physics Letters
dc.source.issue22
dc.source.volume98
imec.availabilityPublished - imec


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