Show simple item record

Stretching-induced interconnect delamination in stretchable electronic circuits

dc.contributor.authorvan der Sluis, Olaf
dc.contributor.authorHsu, Yung-Yu
dc.contributor.authorTimmermans, P H M
dc.contributor.authorGonzalez, Mario
dc.contributor.authorHoefnagels, J P M
dc.date.accessioned2021-10-19T20:16:31Z
dc.date.available2021-10-19T20:16:31Z
dc.date.issued2011
dc.identifier.issn0022-3727
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19964
dc.sourceIIOimport
dc.titleStretching-induced interconnect delamination in stretchable electronic circuits
dc.typeJournal article
dc.contributor.imecauthorGonzalez, Mario
dc.source.peerreviewyes
dc.source.beginpage34008
dc.source.journalJournal of Physics D: Applied Physics
dc.source.issue3
dc.source.volume44
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record