Show simple item record

Identification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor transistors

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M. V.
dc.contributor.authorGarbar, N.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T09:17:24Z
dc.date.available2021-09-30T09:17:24Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2004
dc.sourceIIOimport
dc.titleIdentification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor transistors
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage3874
dc.source.endpage3876
dc.source.journalApplied Physics Letters
dc.source.issue26
dc.source.volume71
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
1977.pdf
Size:
81.71Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record