dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Leonelli, Daniele | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-19T21:03:00Z | |
dc.date.available | 2021-10-19T21:03:00Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20061 | |
dc.source | IIOimport | |
dc.title | Drain voltage dependent analytical model of tunnel field-effect transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Leonelli, Daniele | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 24510 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 2 | |
dc.source.volume | 110 | |
dc.identifier.url | http://link.aip.org/link/?JAP/110/024510 | |
imec.availability | Published - imec | |