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Reliability and retention of floating body RAM on bulk FinFET

dc.contributor.authorAoulaiche, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCaillat, Christian
dc.contributor.authorCollaert, Nadine
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-20T10:02:02Z
dc.date.available2021-10-20T10:02:02Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20295
dc.sourceIIOimport
dc.titleReliability and retention of floating body RAM on bulk FinFET
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage33
dc.source.endpage40
dc.source.journalMicroelectronics and Solid State Electronics
dc.source.issue2
dc.source.volume1
imec.availabilityPublished - open access


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