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Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs

dc.contributor.authorAyala, N.
dc.contributor.authorMartin-Martinez, J.
dc.contributor.authorRodriguez, R.
dc.contributor.authorGonzalez, M.B.
dc.contributor.authorNafria, M.
dc.contributor.authorAymerich, X.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-20T10:03:10Z
dc.date.available2021-10-20T10:03:10Z
dc.date.issued2012
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20318
dc.sourceIIOimport
dc.titleCharacterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1924
dc.source.endpage1927
dc.source.journalMicroelectronics Reliability
dc.source.issue9_10
dc.source.volume52
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271412001990
imec.availabilityPublished - open access


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