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Non-destructive characterization of saw damage in silicon photovoltaics substrates by means of photomodulated optical reflectance

dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorMertens, Paul
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorWostyn, Kurt
dc.contributor.authorPenaud, Julien
dc.contributor.authorJaffrennou, Périne
dc.contributor.authorAbric, Elise
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-20T10:07:39Z
dc.date.available2021-10-20T10:07:39Z
dc.date.issued2012
dc.identifier.issn1610-1634
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20379
dc.sourceIIOimport
dc.titleNon-destructive characterization of saw damage in silicon photovoltaics substrates by means of photomodulated optical reflectance
dc.typeJournal article
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorWostyn, Kurt
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.contributor.orcidimecWostyn, Kurt::0000-0003-3995-0292
dc.source.peerreviewyes
dc.source.beginpage2116
dc.source.endpage2119
dc.source.journalPhysica Status Solidi C
dc.source.issue10_11
dc.source.volume9
imec.availabilityPublished - imec
imec.internalnotesE-MRS Spring Meeting Symposium A: Advanced Silicon Materials Research for Electronic and Photovoltaic Applications III


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