dc.contributor.author | Chen, Yangyin | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Wouters, Dirk | |
dc.date.accessioned | 2021-10-20T10:15:30Z | |
dc.date.available | 2021-10-20T10:15:30Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20446 | |
dc.source | IIOimport | |
dc.title | Insights into Ni-filament formation in unipolar-switching Ni/HfO2/TiN resistive random access memory device | |
dc.type | Journal article | |
dc.contributor.imecauthor | Chen, Yangyin | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113513 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 11 | |
dc.source.volume | 100 | |
imec.availability | Published - open access | |