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Improved methodology for integrated k-value extractions

dc.contributor.authorCiofi, Ivan
dc.contributor.authorBorrello, Gianpaolo
dc.contributor.authorMadia, Oreste
dc.contributor.authorWilson, Chris
dc.contributor.authorVereecke, Bart
dc.contributor.authorBeyer, Gerald
dc.date.accessioned2021-10-20T10:18:09Z
dc.date.available2021-10-20T10:18:09Z
dc.date.issued2012
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20464
dc.sourceIIOimport
dc.titleImproved methodology for integrated k-value extractions
dc.typeJournal article
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorMadia, Oreste
dc.contributor.imecauthorWilson, Chris
dc.contributor.imecauthorVereecke, Bart
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1607
dc.source.endpage1613
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue6
dc.source.volume59
imec.availabilityPublished - open access


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